S17 Prosthetic Arm: Gear Test

This posts serves as a test of the gears that are going to be used wit the servo to rotate the wrist of the prosthetic arm that also rotates the prosthetic hand.

S17 Prosthetic Arm: Attachment Module Test

This is a test for a prosthetic arm attachment that only require’s straight forward attachment to the humeral bone of the customer instead of the use of an uncomfortable over the shoulder strap piece.

S17 Prosthetic Arm: Iteration of the Arm Design

This post is about the different problems faced during the design of the prosthetic arm and how they were overcome.

S17 Prosthetic Arm: Servo Rotation Accelerometer Test

This test is conducted to make sure that the wrist will work with the accelerometer in order to activate rotation only when it is in the correct position.

S17 Prosthetic Arm: Temperature Sensor Waveform Input Test

For this test, we are checking to make sure that we can record the temperature input as a waveform and use that information to employ the safety mechanism of powering down the PCB if any of the components get too hot.

S17 Prosthetic Arm: Sleep ISR Test with Analog Sensor

The Sleep ISR Test is done to make sure that once it sees a fluctuation in an analog signal, not unlike a temperature sensing heat breaching 50 degrees celcius, it will power down the MCU and the reduced current draw will cool down the PCB and all of her components.

S17 Prosthetic Arm: Finite State Machine Servo Test

The purpose of this test is to make sure our code can rotate the servo in the wrist of the prosthetic arm only when the EMG sensor detects muscle contraction.

S17 Prosthetic Arm: Buck Converter LTSPICE Simulation

To test if the buck converter we have designed is able to be used to step-down the voltage of the battery at 11.1V to the voltage needed to power the servos, at 5V, safely.

S17 Prosthetic Arm: Kill Switch Test

This test if performed to try to confirm that a switch on the V- path back to battery is able to turn off the prosthetic arm and hand system without damaging other electronic components.